News Article
Nanotube Boost For Electron Microscopy
Researchers from France and the Netherlands have found that multiwalled carbon nanotubes can have a "reduced brightness" ten times larger than state-of-the-art electron sources for microscope systems (Nature, November 28, 2002).
Researchers from France and the Netherlands have found that multiwalled carbon nanotubes can have a "reduced brightness" ten times larger than state-of-the-art electron sources for microscope systems (Nature, November 28, 2002).