FREE Trial Downloads For Award Winning Wafer Analysis Software For Fabs

Several kinds of operations can be applied to the wafer maps such as rotation, shifting of the grid in the X or Y direction, or mirroring the data along the X or Y axis.

A Sigma Filter allows for the elimination of sites that exceed a user-defined range (e.g. measurement errors). It is also possible to compare different sets of data by adding, subtracting or dividing entire wafer maps. Typical applications include map generation for manually operated metrology tools and standardized visualization for different automatic metrology equipment (e.g. different types of four point probes in the same fab). WAFERMAP allows users to work off-line and to analyze and edit metrology data outside of the clean room. Its the perfect solution for paperless fabs.

Also, after your trial, if you purchase a license for this software and you are a Eurosemi Plus reader you will receive a discount!

Click on the banner below to get your free download or find out more about WaferMap.

Several kinds of operations can be applied to the wafer maps such as rotation, shifting of the grid in the X or Y direction, or mirroring the data along the X or Y axis.

A Sigma Filter allows for the elimination of sites that exceed a user-defined range (e.g. measurement errors). It is also possible to compare different sets of data by adding, subtracting or dividing entire wafer maps. Typical applications include map generation for manually operated metrology tools and standardized visualization for different automatic metrology equipment (e.g. different types of four point probes in the same fab). WAFERMAP allows users to work off-line and to analyze and edit metrology data outside of the clean room. Its the perfect solution for paperless fabs.

Also, after your trial, if you purchase a license for this software and you are a Eurosemi Plus reader you will receive a discount!

Click on the banner below to get your free download or find out more about WaferMap.