Forum Targets Microsystem Testing
MEMUNITY results from the Eurimus-funded MICROTEST project which aims to develop special test systems for unpackaged MEMS and bring equipment and device manufacturers together to promote standardisation and knowledge-sharing within the MEMS community.
The cost of a MEMS device is a major prohibiting factor for the widespread use of MEMS in diverse applications. Testing at wafer level, before the device is packaged, can not only reduce production costs, it also aids process optimisation and speeds up time to data during the design stages.
"The ultimate goal is to continue the development of efficient test methods and spread knowledge about testing, which will help expand the industry and benefit the end customer," says Jens Branebjerg, business manager for MEMS at DELTA.
Frank-Michael Werner, SUSS' product manager for MEMS test, adds "By testing at wafer level, the exorbitant packaging costs will not be wasted on bad die thus bringing the cost of the end devices down to an acceptable level. It is our hope that manufacturers will find MEMUNITY a strong partner who can guide them through the first steps to on-wafer testing thereby making their devices less expensive to manufacture and decreasing the time to market."
